I don't know if @M. Alaggan was talking about this kind of faults, but they certainly look alike: transient faults.
In the model of DVFS, where one can modify the frequency and voltage in order to reduce the energy consumption, Zhu and Aydin in this paper(pdf) used a fault model for DVFS. They consider transient failures, which are
faults caused by software errors for example. They
invalidate only the execution of the current task and the processor
subject to that failure will be able to recover and execute the
subsequent task assigned to it (if any).
For transient failures, Shatz and Wang introduced a reliability model in this paper (1989) which states that the radiation-induced transient faults follow a Poisson
distribution. The parameter $\lambda$ of the Poisson distribution is
then:
\begin{equation}
\label{fault}
\lambda(f)=\lambda_p \; e^{d\frac{f_{max}-f}{f_{max}-f_{min}}},
\end{equation}
where $f_{min}\leq f \leq f_{max}$ is the processing speed, the exponent
$d\geq0$ is a constant, indicating the sensitivity of fault
rates to DVFS, and $\lambda_p$ is the average fault rate
corresponding to $f_{max}$ on processor $p$. We see that reducing the speed for energy
saving increases the fault rate exponentially. The reliability of a
task $T_i$ executed on a processor $p$ at speed $f_i$ is:
$$
R_i(f_i)=e^{-\lambda(f_i)\times Execution~Time(T_i,f_i)}.
$$
Sorry to post this so long after the original post, but I found this question as I was working on this subject :).
When not studying DVFS, these faults still exist, the formulaes are probably still valid (or adaptable). You can find more information on transient failures without DVFS here.